Please welcome new ME faculty members Dr. Christopher Pannier and Dr. Lei Chen

10/11/2019

Please welcome Mechanical Engineering’s newest faculty members--Dr. Lei Chen and Dr. Christopher Pannier.

Dr. Lei Chen and Dr. Christopher Pannier
Dr. Lei Chen and Dr. Christopher Pannier
L-R: Dr. Lei Chen and Dr. Christopher Pannier

Dr. Lei Chen joins the University of Michigan-Dearborn from Mississippi State University. Dr. Chen received his B.S. and M.S. degrees from Huazhong University of Science & Technology, China in 2005 and 2007, respectively, and his Ph.D. degree from the National University of Singapore in 2012. His research interests are in the broad area of advanced manufacturing and materials design, with a focus on additive manufacturing of metals and piezoelectric composites. Dr. Chen has published over 70 papers in top international journals including NatureNature CommunicationsAdvanced MaterialsActa MaterialiaAdditive Manufacturing, etc. and has received a number of awards, the most recent of which are the prestigious ASEE Southeastern Section New Researcher Award (2018) and ORAU Ralph E. Powe Junior Faculty Enhancement Award (2017).

Dr. Christopher Pannier joins the University of Michigan-Dearborn from the University of Michigan, Ann Arbor. Dr. Pannier received his B.S. degree in nuclear engineering from Texas A&M University in 2014 and his M.S. and Ph.D. degrees in mechanical engineering from the University of Michigan, Ann Arbor in 2016 and 2019, respectively, with Professor Kira Barton as his research adviser. His dissertation was titled “Modeling and Topography Control of Microscale Additive Manufacturing.” His research interests include modeling and control of hybrid (additive + subtractive) manufacturing and developing digital twins of advanced manufacturing processes to achieve environmental sustainability gains in each phase of the product lifecycle. He is a recipient of the U.S. National Science Foundation’s Graduate Research Fellowship and the University of Michigan’s Rackham Merit Fellowship.

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